Investigation of passivation effects in InP HEMT layers

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Authors
Van Hove, Marleen; Finders, Jo; van der Zanden, Koen; Geurts, J.; Van Rossum, Marc
Conference
Symposium on Diagnostic Techniques for Semiconductor Materials Processing II
Title
Investigation of passivation effects in InP HEMT layers
Publication type
Proceedings paper
Embargo date
9999-12-31
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