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Molecular Beam Epitaxy study of a common a-GeO2 interfacial passivation layer for Ge- and GaAs-based MOS heterostructures
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Molecular Beam Epitaxy study of a common a-GeO2 interfacial passivation layer for Ge- and GaAs-based MOS heterostructures
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Merckling, Clement
;
Penaud, Julien
;
Bellenger, Florence
;
Kohen, David
;
Brammertz, Guy
;
Alian, AliReza
;
Pourtois, Geoffrey
;
Scarrozza, Marco
;
Houssa, Michel
;
El-Kazzi, Mario
;
Dekoster, Johan
;
Caymax, Matty
;
Meuris, Marc
;
Heyns, Marc
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1896
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Acq. date: 2025-12-16
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Metrics
Views
1896
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-16
Citations