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Variability aware modeling of SoCs: from device variations to manufactured system yield

dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorDierickx, Bart
dc.contributor.authorZuber, Paul
dc.contributor.authorDobrovolny, Petr
dc.contributor.authorKutscherauer, Florian
dc.contributor.authorRoussel, Philippe
dc.contributor.authorPoliakov, Pavel
dc.date.accessioned2021-10-18T00:51:37Z
dc.date.available2021-10-18T00:51:37Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15872
dc.sourceIIOimport
dc.titleVariability aware modeling of SoCs: from device variations to manufactured system yield
dc.typeProceedings paper
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewyes
dc.source.conferenceInternational Symposium on Quality Electronic Design
dc.source.conferencedate16/03/2009
dc.source.conferencelocationSan Jose, CA USA
dc.identifier.urlhttp://www.isqed.org/
imec.availabilityPublished - imec


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