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Investigation of capacitance-voltage characteristics in Ge /high-k MOS devices
Publication:
Investigation of capacitance-voltage characteristics in Ge /high-k MOS devices
Date
2009
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Moreau, M.
;
Munteanu, D.
;
Autran, J.-L.
;
Bellenger, Florence
;
Mitard, Jerome
;
Houssa, Michel
Journal
Journal of Non-Crystalline Solids
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1922
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1922
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations