Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Articles
View item
imec Publications Repository
imec Publications
Articles
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Investigation of capacitance-voltage characteristics in Ge /high-k MOS devices
View/
open
19538.pdf (356.7Kb)
Metadata
Show full item record
Authors
Moreau, M.
;
Munteanu, D.
;
Autran, J.-L.
;
Bellenger, Florence
;
Mitard, Jerome
;
Houssa, Michel
ISSN
0022-3093
Issue
18
Journal
Journal of Non-Crystalline Solids
Volume
355
Title
Investigation of capacitance-voltage characteristics in Ge /high-k MOS devices
Publication type
Journal article
Embargo date
9999-12-31
Collections
Articles
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login