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Understanding and importance of defects in advanced materials

dc.contributor.authorPantisano, Luigi
dc.contributor.authorTrojman, Lionel
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorO'Connor, R.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-18T01:26:14Z
dc.date.available2021-10-18T01:26:14Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15970
dc.sourceIIOimport
dc.titleUnderstanding and importance of defects in advanced materials
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage651
dc.source.endpage658
dc.source.conferenceInternational Semiconductor Technology Conference - ISTC/CSTIC
dc.source.conferencedate19/03/2009
dc.source.conferencelocationShanghai China
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 18, issue 1


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