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Analysis of standard and strained FinFET operation in source-follower buffer configuration

dc.contributor.authorPavanello, M.A.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRooyackers, Rita
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-18T01:35:16Z
dc.date.available2021-10-18T01:35:16Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15997
dc.sourceIIOimport
dc.titleAnalysis of standard and strained FinFET operation in source-follower buffer configuration
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage59
dc.source.endpage60
dc.source.conference5th EUROSOI Workshop
dc.source.conferencedate19/01/2009
dc.source.conferencelocationGöteborg Sweden
imec.availabilityPublished - imec


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