dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Clima, Sergiu | |
dc.contributor.author | Sankaran, Kiroubanand | |
dc.contributor.author | Delugas, Pietro | |
dc.contributor.author | Fiorentini, Vincenzo | |
dc.contributor.author | Magnus, Wim | |
dc.contributor.author | Soree, Bart | |
dc.contributor.author | Van Elshocht, Sven | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Wouters, Dirk | |
dc.contributor.author | De Gendt, Stefan | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Kittl, Jorge | |
dc.date.accessioned | 2021-10-18T01:54:55Z | |
dc.date.available | 2021-10-18T01:54:55Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16052 | |
dc.source | IIOimport | |
dc.title | Modeling of alternative high-k dielectrics for memory based applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.imecauthor | Clima, Sergiu | |
dc.contributor.imecauthor | Sankaran, Kiroubanand | |
dc.contributor.imecauthor | Magnus, Wim | |
dc.contributor.imecauthor | Soree, Bart | |
dc.contributor.imecauthor | Van Elshocht, Sven | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.contributor.orcidimec | Clima, Sergiu::0000-0002-4044-9975 | |
dc.contributor.orcidimec | Sankaran, Kiroubanand::0000-0001-6988-7269 | |
dc.contributor.orcidimec | Soree, Bart::0000-0002-4157-1956 | |
dc.contributor.orcidimec | Van Elshocht, Sven::0000-0002-6512-1909 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 131 | |
dc.source.endpage | 145 | |
dc.source.conference | High Dielectric Constant Materials and Gate Stacks 7 | |
dc.source.conferencedate | 4/10/2009 | |
dc.source.conferencelocation | Vienna Austria | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 25, issue 6 | |