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Effect of rotation, gate-dielectric and SEG on the noise

dc.contributor.authorPut, Sofie
dc.contributor.authorMehta, Harsh
dc.contributor.authorCollaert, Nadine
dc.contributor.authorVan Uffelen, M.
dc.contributor.authorLeroux, P.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-18T01:58:24Z
dc.date.available2021-10-18T01:58:24Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16062
dc.sourceIIOimport
dc.titleEffect of rotation, gate-dielectric and SEG on the noise
dc.typeProceedings paper
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage123
dc.source.endpage124
dc.source.conference5th EUROSOI Workshop
dc.source.conferencedate19/01/2009
dc.source.conferencelocationGöteborg Sweden
imec.availabilityPublished - imec


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