dc.contributor.author | Sahhaf, Sahar | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Kauerauf, Thomas | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-18T02:33:16Z | |
dc.date.available | 2021-10-18T02:33:16Z | |
dc.date.issued | 2009 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16149 | |
dc.source | IIOimport | |
dc.title | A new TDDB reliability prediction methodology accounting for multiple SBD and wear out | |
dc.type | Journal article | |
dc.contributor.imecauthor | Sahhaf, Sahar | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1424 | |
dc.source.endpage | 1432 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 7 | |
dc.source.volume | 56 | |
imec.availability | Published - open access | |