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A new TDDB reliability prediction methodology accounting for multiple SBD and wear out
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Authors
Sahhaf, Sahar
;
Degraeve, Robin
;
Roussel, Philippe
;
Kaczer, Ben
;
Kauerauf, Thomas
;
Groeseneken, Guido
ISSN
0018-9383
Issue
7
Journal
IEEE Transactions on Electron Devices
Volume
56
Title
A new TDDB reliability prediction methodology accounting for multiple SBD and wear out
Publication type
Journal article
Embargo date
9999-12-31
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