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Experimental assessment of self-heating in SOI FinFETs

dc.contributor.authorScholten, Andries
dc.contributor.authorSmit, G.D.J.
dc.contributor.authorPijper, R.M.T.
dc.contributor.authorTiemeijer, L.F.
dc.contributor.authorTuinhout, H.P.
dc.contributor.authorvan der Steen, J.L.P.J.
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorBraccioli, M.
dc.contributor.authorKlaassen, D.B.M.
dc.date.accessioned2021-10-18T02:42:55Z
dc.date.available2021-10-18T02:42:55Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16174
dc.sourceIIOimport
dc.titleExperimental assessment of self-heating in SOI FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.source.peerreviewno
dc.source.beginpage305
dc.source.endpage308
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate7/12/2009
dc.source.conferencelocationBaltimore, MD USA
imec.availabilityPublished - imec


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