dc.contributor.author | Scholz, Mirko | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Thijs, Steven | |
dc.contributor.author | Sawada, Masanori | |
dc.contributor.author | Nakaei, T. | |
dc.contributor.author | Hasebe, Takumi | |
dc.contributor.author | Lafonteese, David | |
dc.contributor.author | Vashchenko, Vladislav | |
dc.contributor.author | Vandersteen, Gerd | |
dc.contributor.author | Hopper, P. | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-18T02:44:14Z | |
dc.date.available | 2021-10-18T02:44:14Z | |
dc.date.issued | 2009-09 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16177 | |
dc.source | IIOimport | |
dc.title | On-wafer human metal model measurements for system-level ESD analysis | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.imecauthor | Vandersteen, Gerd | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 5B.4 | |
dc.source.conference | 31st Annual EOS/ESD Symposium | |
dc.source.conferencedate | 30/08/2009 | |
dc.source.conferencelocation | Anaheim, CA USA | |
imec.availability | Published - open access | |