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Atom probe microscopy of three-dimensional distribution of silicon isotopes in 28Si/30Si isotope superlattices with sub-nanometer spatial resolution
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Atom probe microscopy of three-dimensional distribution of silicon isotopes in 28Si/30Si isotope superlattices with sub-nanometer spatial resolution
Date
2009
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Shimizu, Yasuo
;
Kawamura, Y.
;
Uematsu, M.
;
Itoh, Kohei M.
;
Tomita, Mitsuhiro
;
Sasaki, Mikio
;
Uchida, Hiroshi
;
Takahashi, Mamoru
Journal
Journal of Applied Physics
Abstract
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1932
since deposited on 2021-10-18
Acq. date: 2025-10-28
Citations
Metrics
Views
1932
since deposited on 2021-10-18
Acq. date: 2025-10-28
Citations