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pMOSFET off-state leakage and junction leakage current in Ge-based devices

dc.contributor.authorSimoen, Eddy
dc.contributor.authorDe Stefano, Francesca
dc.contributor.authorEneman, Geert
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorClaeys, Cor
dc.contributor.authorCrupi, F.
dc.date.accessioned2021-10-18T03:06:03Z
dc.date.available2021-10-18T03:06:03Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16228
dc.sourceIIOimport
dc.titlepMOSFET off-state leakage and junction leakage current in Ge-based devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDe Stefano, Francesca
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage61
dc.source.endpage66
dc.source.conferenceInternational Semiconductor Technology Conference - ISTC/CSTIC
dc.source.conferencedate19/03/2009
dc.source.conferencelocationShanghai China
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 18, nr. 1


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