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Evaluation of switching properties of CuTCNQ-based non-volatile memory at nanometer scale by conductive-AFM

dc.contributor.authorThomas, Maryline
dc.contributor.authorDeleruyelle, Damien
dc.contributor.authorKever, Thorsten
dc.contributor.authorMuller, Robert
dc.contributor.authorDemolliens, Antoine
dc.contributor.authorTurquat, Christian
dc.contributor.authorGoux, Ludovic
dc.contributor.authorBoettger, Ulrich
dc.contributor.authorWouters, Dirk
dc.contributor.authorWaser, Rainer
dc.contributor.authorMuller, Christophe
dc.date.accessioned2021-10-18T03:36:13Z
dc.date.available2021-10-18T03:36:13Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16305
dc.sourceIIOimport
dc.titleEvaluation of switching properties of CuTCNQ-based non-volatile memory at nanometer scale by conductive-AFM
dc.typeOral presentation
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewno
dc.source.conference18th Workshop Materials for Advanced Metallization - MAM
dc.source.conferencedate8/03/2009
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


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