dc.contributor.author | Todi, V. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Sundaram, K.B. | |
dc.date.accessioned | 2021-10-18T03:38:54Z | |
dc.date.available | 2021-10-18T03:38:54Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16312 | |
dc.source | IIOimport | |
dc.title | Analysis of then substrate current in Ge pMOSFETs | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 2389 | |
dc.source.conference | 216th ECS Meeting | |
dc.source.conferencedate | 4/10/2009 | |
dc.source.conferencelocation | Vienna Austria | |
imec.availability | Published - open access | |