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Analysis of then substrate current in Ge pMOSFETs

dc.contributor.authorTodi, V.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorEneman, Geert
dc.contributor.authorClaeys, Cor
dc.contributor.authorSundaram, K.B.
dc.date.accessioned2021-10-18T03:38:54Z
dc.date.available2021-10-18T03:38:54Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16312
dc.sourceIIOimport
dc.titleAnalysis of then substrate current in Ge pMOSFETs
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage2389
dc.source.conference216th ECS Meeting
dc.source.conferencedate4/10/2009
dc.source.conferencelocationVienna Austria
imec.availabilityPublished - open access


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