Recommendations to further improvements of HBM ESD component level test specifications
dc.contributor.author | Verhaege, Koen | |
dc.contributor.author | Russ, Christian | |
dc.contributor.author | Robinson-Hahn, D. | |
dc.contributor.author | Farris, M. | |
dc.contributor.author | Scanlon, J. | |
dc.contributor.author | Lin, Don | |
dc.contributor.author | Veltri, J. | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-09-29T15:48:27Z | |
dc.date.available | 2021-09-29T15:48:27Z | |
dc.date.issued | 1996 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1631 | |
dc.source | IIOimport | |
dc.title | Recommendations to further improvements of HBM ESD component level test specifications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 40 | |
dc.source.endpage | 53 | |
dc.source.conference | Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium | |
dc.source.conferencedate | 10/09/1996 | |
dc.source.conferencelocation | Orlando, FL USA | |
imec.availability | Published - open access |