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Investigation of window instability in program/erase cycling of TANOS NAND Flash memory

dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorBreuil, Laurent
dc.contributor.authorCacciato, Antonio
dc.contributor.authorRothschild, Aude
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-18T04:00:26Z
dc.date.available2021-10-18T04:00:26Z
dc.date.issued2009-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16364
dc.sourceIIOimport
dc.titleInvestigation of window instability in program/erase cycling of TANOS NAND Flash memory
dc.typeProceedings paper
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewyes
dc.source.beginpage84
dc.source.endpage85
dc.source.conferenceInternational Memory Workshop - IMW
dc.source.conferencedate10/05/2009
dc.source.conferencelocationMonterey, Ca USA
imec.availabilityPublished - imec


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