Show simple item record

EUV lithography development progress in IMEC

dc.contributor.authorVandenberghe, Geert
dc.contributor.authorHendrickx, Eric
dc.contributor.authorGoethals, Mieke
dc.contributor.authorJonckheere, Rik
dc.contributor.authorGronheid, Roel
dc.contributor.authorRonse, Kurt
dc.date.accessioned2021-10-18T04:22:53Z
dc.date.available2021-10-18T04:22:53Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16418
dc.sourceIIOimport
dc.titleEUV lithography development progress in IMEC
dc.typeOral presentation
dc.contributor.imecauthorVandenberghe, Geert
dc.contributor.imecauthorHendrickx, Eric
dc.contributor.imecauthorJonckheere, Rik
dc.contributor.imecauthorGronheid, Roel
dc.contributor.imecauthorRonse, Kurt
dc.contributor.orcidimecJonckheere, Rik::0000-0003-2211-9443
dc.contributor.orcidimecRonse, Kurt::0000-0003-0803-4267
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceSPIE Lithography Asia
dc.source.conferencedate18/11/2009
dc.source.conferencelocationTaipei Taiwan
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
19022.pdf
Size:
5.737Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record