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From single-atom spectroscopy to lifetime enhanced triplet transport in MOSFETs

dc.contributor.authorVerduijn, J.
dc.contributor.authorLansbergen, G.P.
dc.contributor.authorTettamanzi, G.C.
dc.contributor.authorRahman, R.
dc.contributor.authorBiesemans, Serge
dc.contributor.authorCollaert, Nadine
dc.contributor.authorKlimeck, G.
dc.contributor.authorHollenberg, L.C.L.
dc.contributor.authorRogge, S.
dc.date.accessioned2021-10-18T04:44:49Z
dc.date.available2021-10-18T04:44:49Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16469
dc.sourceIIOimport
dc.titleFrom single-atom spectroscopy to lifetime enhanced triplet transport in MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage258
dc.source.endpage259
dc.source.conferenceInternational Conference on Solid-State Devices and Materials - SSDM
dc.source.conferencedate7/10/2009
dc.source.conferencelocationSendai Japan
imec.availabilityPublished - open access


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