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'1 Thru +2.5 Reflects': A new technique for de-embedding MIC/MMIC device measurements in fixed-length fixtures

dc.contributor.authorWang, Connie
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorVan Rossum, Marc
dc.date.accessioned2021-09-29T15:51:24Z
dc.date.available2021-09-29T15:51:24Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1647
dc.sourceIIOimport
dc.title'1 Thru +2.5 Reflects': A new technique for de-embedding MIC/MMIC device measurements in fixed-length fixtures
dc.typeProceedings paper
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorDe Raedt, Walter
dc.source.peerreviewno
dc.source.beginpage174
dc.source.endpage177
dc.source.conferenceProceedings of the European Microwave Conference; September 1996; Prague, Czech Republic.
dc.source.conferencelocation
imec.availabilityPublished - imec


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