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Comparative study on the effects of PVT variations between a novel all-MOS current reference and alternative CMOS solutions

dc.contributor.authorWindels, Jindrich
dc.contributor.authorVan Praet, Christophe
dc.contributor.authorDe Pauw, Herbert
dc.contributor.authorDoutreloigne, Jan
dc.date.accessioned2021-10-18T05:21:15Z
dc.date.available2021-10-18T05:21:15Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16551
dc.sourceIIOimport
dc.titleComparative study on the effects of PVT variations between a novel all-MOS current reference and alternative CMOS solutions
dc.typeProceedings paper
dc.contributor.imecauthorDe Pauw, Herbert
dc.contributor.imecauthorDoutreloigne, Jan
dc.contributor.orcidimecDe Pauw, Herbert::0000-0002-4767-8762
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage49
dc.source.endpage53
dc.source.conference52nd IEEE International Midwest Symposium on Circuits and Systems - MWSCAS
dc.source.conferencedate2/08/2009
dc.source.conferencelocationCancún Mexico
imec.availabilityPublished - imec


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