Show simple item record

A discharge-based multi-pulse technique (DMP) for probing electron trap energy distribution in high-k materials for Flash memory applications

dc.contributor.authorZheng, X. F.
dc.contributor.authorZhang, W. .D
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorZhang, J. F.
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-18T05:47:49Z
dc.date.available2021-10-18T05:47:49Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16611
dc.sourceIIOimport
dc.titleA discharge-based multi-pulse technique (DMP) for probing electron trap energy distribution in high-k materials for Flash memory applications
dc.typeProceedings paper
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage139
dc.source.endpage142
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate7/12/2009
dc.source.conferencelocationBaltimore US
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
19490.pdf
Size:
676.3Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record