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Improved analytical model for ZTC bias point for strained tri-gates FinFETs
Publication:
Improved analytical model for ZTC bias point for strained tri-gates FinFETs
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Date
2010
Proceedings Paper
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21495.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Almeida, L.M.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
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1863
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Acq. date: 2025-12-12
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Metrics
Views
1863
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-12
Citations