Improved analytical model for ZTC bias point for strained tri-gates FinFETs

Thumbnail
View/open
Metadata
Show full item record
Authors
Almeida, L.M.; Martino, J.A.; Simoen, Eddy; Claeys, Cor
Conference
Microelectronics Technology and Devices - SBMICRO 2010
Title
Improved analytical model for ZTC bias point for strained tri-gates FinFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections