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Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric

dc.contributor.authorAmat, Esteve
dc.contributor.authorKauerauf, Thomas
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRodríguez, Rosana
dc.contributor.authorNafría, Montse
dc.contributor.authorAymerich, Xavier
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-18T15:15:35Z
dc.date.available2021-10-18T15:15:35Z
dc.date.issued2010
dc.identifier.issn0894-3370
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16650
dc.sourceIIOimport
dc.titleSimulation of the hot-carrier degradation in short channel transitors with high-K dielectric
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewyes
dc.source.beginpage315
dc.source.endpage323
dc.source.journalInternational Journal of Numerical Modelling
dc.source.issue4_5
dc.source.volume23
imec.availabilityPublished - imec


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