Authors

Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido

ISSN

0894-3370

Issue

4_5

Journal

International Journal of Numerical Modelling

Volume

23

Title

Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric

Publication type

Journal article