Publication:
Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric
Date
| dc.contributor.author | Amat, Esteve | |
| dc.contributor.author | Kauerauf, Thomas | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Rodríguez, Rosana | |
| dc.contributor.author | Nafría, Montse | |
| dc.contributor.author | Aymerich, Xavier | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-10-18T15:15:35Z | |
| dc.date.available | 2021-10-18T15:15:35Z | |
| dc.date.issued | 2010 | |
| dc.identifier.issn | 0894-3370 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16650 | |
| dc.source.beginpage | 315 | |
| dc.source.endpage | 323 | |
| dc.source.issue | 4_5 | |
| dc.source.journal | International Journal of Numerical Modelling | |
| dc.source.volume | 23 | |
| dc.title | Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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