Publication:

Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1903 since deposited on 2021-10-18
Acq. date: 2025-10-24

Citations

Metrics

Views

1903 since deposited on 2021-10-18
Acq. date: 2025-10-24

Citations