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Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric
Publication:
Simulation of the hot-carrier degradation in short channel transitors with high-K dielectric
Date
2010
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Amat, Esteve
;
Kauerauf, Thomas
;
Degraeve, Robin
;
Rodríguez, Rosana
;
Nafría, Montse
;
Aymerich, Xavier
;
Groeseneken, Guido
Journal
International Journal of Numerical Modelling
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1903
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations
Metrics
Views
1903
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations