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Articles
BJT mode endurance on a 1T-RAM bulk FinFET device
Publication:
BJT mode endurance on a 1T-RAM bulk FinFET device
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Date
2010
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Aoulaiche, Marc
;
Collaert, Nadine
;
Degraeve, Robin
;
Lu, Zhichao
;
De Wachter, Bart
;
Jurczak, Gosia
;
Altimime, Laith
Journal
IEEE Electron Device Letters
Abstract
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1995
since deposited on 2021-10-18
4
last month
3
last week
Acq. date: 2026-01-09
Citations
Metrics
Views
1995
since deposited on 2021-10-18
4
last month
3
last week
Acq. date: 2026-01-09
Citations