BJT mode endurance on a 1T-RAM bulk FinFET device

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Authors

Aoulaiche, Marc; Collaert, Nadine; Degraeve, Robin; Lu, Zhichao; De Wachter, Bart; Jurczak, Gosia; Altimime, Laith

ISSN

0741-3106

Issue

12

Journal

IEEE Electron Device Letters

Volume

31

Title

BJT mode endurance on a 1T-RAM bulk FinFET device

Publication type

Journal article

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