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Comprehensive Rutherford backscattering and channeling study of ion-beam-synthesized ErSi1.7 layers
Publication:
Comprehensive Rutherford backscattering and channeling study of ion-beam-synthesized ErSi1.7 layers
Date
1996
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Ming Fang
;
Vantomme, Andre
;
De Wachter, Jo
;
Degroote, S.
;
Pattyn, Hugo
;
Langouche, G.
;
Bender, Hugo
Journal
Journal of Applied Physics
Abstract
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1931
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1931
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations