dc.contributor.author | Bekaert, Joost | |
dc.contributor.author | Van Look, Lieve | |
dc.contributor.author | Truffert, Vincent | |
dc.contributor.author | Lazzarino, Frederic | |
dc.contributor.author | Vandenberghe, Geert | |
dc.contributor.author | Reybrouck, Mario | |
dc.contributor.author | Tarutani, Shinji | |
dc.date.accessioned | 2021-10-18T15:19:27Z | |
dc.date.available | 2021-10-18T15:19:27Z | |
dc.date.issued | 2010-12 | |
dc.identifier.issn | 1537-1646 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16725 | |
dc.source | IIOimport | |
dc.title | Comparing positive and negative tone development process for printing the metal and contact layers of the 32- and 22-nm node | |
dc.type | Journal article | |
dc.contributor.imecauthor | Bekaert, Joost | |
dc.contributor.imecauthor | Van Look, Lieve | |
dc.contributor.imecauthor | Truffert, Vincent | |
dc.contributor.imecauthor | Lazzarino, Frederic | |
dc.contributor.imecauthor | Vandenberghe, Geert | |
dc.contributor.imecauthor | Reybrouck, Mario | |
dc.contributor.orcidimec | Bekaert, Joost::0000-0003-3075-3479 | |
dc.contributor.orcidimec | Truffert, Vincent::0000-0001-7851-830X | |
dc.contributor.orcidimec | Lazzarino, Frederic::0000-0001-7961-9727 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 43007 | |
dc.source.journal | Journal of Micro/Nanolithography MEMS and MOEMS | |
dc.source.issue | 4 | |
dc.source.volume | 9 | |
imec.availability | Published - open access | |