Substrate noise coupling mechanisms in lightly doped CMOS transistors

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Authors

Bronckers, Stephane; Van der Plas, Geert; Vandersteen, Gerd; Rolain, Yves

ISSN

0018-9456

Issue

6

Journal

IEEE Transactions on Instrumentation and Measurement

Volume

59

Title

Substrate noise coupling mechanisms in lightly doped CMOS transistors

Publication type

Journal article

Embargo date

9999-12-31

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