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Substrate noise coupling mechanisms in lightly doped CMOS transistors

dc.contributor.authorBronckers, Stephane
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorRolain, Yves
dc.date.accessioned2021-10-18T15:26:53Z
dc.date.available2021-10-18T15:26:53Z
dc.date.issued2010
dc.identifier.issn0018-9456
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16804
dc.sourceIIOimport
dc.titleSubstrate noise coupling mechanisms in lightly doped CMOS transistors
dc.typeJournal article
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1727
dc.source.endpage1733
dc.source.journalIEEE Transactions on Instrumentation and Measurement
dc.source.issue6
dc.source.volume59
imec.availabilityPublished - open access


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