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Fin shape influence on the analog performance of standard and trained MuGFETs

dc.contributor.authorBühler, R.T.
dc.contributor.authorMartino, J.A.
dc.contributor.authorAgopian, P.G.D.
dc.contributor.authorGiacomini, R.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-18T15:27:45Z
dc.date.available2021-10-18T15:27:45Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16812
dc.sourceIIOimport
dc.titleFin shape influence on the analog performance of standard and trained MuGFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceSOI Conference
dc.source.conferencedate11/10/2010
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec


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