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'Atomistic' simulation of RTS amplitudes due to single and multiple charged defect states and their interactions

dc.contributor.authorBukhori, M. F.
dc.contributor.authorGrasser, Tibor
dc.contributor.authorKaczer, Ben
dc.contributor.authorReisinger, Hans
dc.contributor.authorAsenov, Asen
dc.date.accessioned2021-10-18T15:27:52Z
dc.date.available2021-10-18T15:27:52Z
dc.date.issued2010-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16813
dc.sourceIIOimport
dc.title'Atomistic' simulation of RTS amplitudes due to single and multiple charged defect states and their interactions
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpage76
dc.source.endpage79
dc.source.conferenceIEEE International Integrated Reliability Workshop - IIRW
dc.source.conferencedate17/10/2010
dc.source.conferencelocationLake Tahoe, CA USA
imec.availabilityPublished - imec


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