Publication:
Positive and negative bias temperature instability on sub-nanometer EOT high-K MOSFETs
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1887 since deposited on 2021-10-18
1last month
Acq. date: 2026-02-24
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Statistics
Views
1887 since deposited on 2021-10-18
1last month
Acq. date: 2026-02-24
Citations