dc.contributor.author | Cho, Moon Ju | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Govoreanu, Bogdan | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Zahid, Mohammed | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Arreghini, Antonio | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-18T15:35:25Z | |
dc.date.available | 2021-10-18T15:35:25Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16867 | |
dc.source | IIOimport | |
dc.title | A consistent model for oxide trap profiling with the trap spectroscopy by charge injection and sensing (TSCIS) technique | |
dc.type | Journal article | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Govoreanu, Bogdan | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Arreghini, Antonio | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Arreghini, Antonio::0000-0002-7493-9681 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1384 | |
dc.source.endpage | 1391 | |
dc.source.journal | Solid-State Electronics | |
dc.source.issue | 11 | |
dc.source.volume | 54 | |
imec.availability | Published - imec | |