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Impact of radiation on the operation and reliability of deep submicron CMOS technologies

dc.contributor.authorClaeys, Cor
dc.contributor.authorPut, Sofie
dc.contributor.authorGriffoni, Alessio
dc.contributor.authorCester, A.
dc.contributor.authorGerardin, S.
dc.contributor.authorMeneghesso, G.
dc.contributor.authorPaccagnella, A.
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-18T15:38:31Z
dc.date.available2021-10-18T15:38:31Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16888
dc.sourceIIOimport
dc.titleImpact of radiation on the operation and reliability of deep submicron CMOS technologies
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage39
dc.source.endpage46
dc.source.conferenceChina Semiconductor Technology International Conference - CSTIC
dc.source.conferencedate18/03/2010
dc.source.conferencelocationShanghai China
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 27, Issue 1


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