dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-18T15:43:31Z | |
dc.date.available | 2021-10-18T15:43:31Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16918 | |
dc.source | IIOimport | |
dc.title | Theoretical aspects of reliability statistics and data analysis | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.source.peerreview | no | |
dc.source.conference | IEEE International Reliability Physics Symposium | |
dc.source.conferencedate | 2/05/2010 | |
dc.source.conferencelocation | Anaheim, CA USA | |
imec.availability | Published - imec | |
imec.internalnotes | Tutorial | |