dc.contributor.author | de Marneffe, Jean-Francois | |
dc.contributor.author | Jarnac, Amelie | |
dc.contributor.author | Conard, Thierry | |
dc.contributor.author | Hendrickx, Dirk | |
dc.contributor.author | Huffman, Craig | |
dc.contributor.author | Kunnen, Eddy | |
dc.contributor.author | Lazzarino, Frederic | |
dc.contributor.author | Milenin, Alexey | |
dc.contributor.author | Shamiryan, Denis | |
dc.contributor.author | Struyf, Herbert | |
dc.contributor.author | Vandervorst, Alain | |
dc.contributor.author | Urbanowicz, Adam | |
dc.contributor.author | Boullart, Werner | |
dc.date.accessioned | 2021-10-18T15:49:14Z | |
dc.date.available | 2021-10-18T15:49:14Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16951 | |
dc.source | IIOimport | |
dc.title | The small-gap technique: understanding an ion-shading method for plasma-surface interactions study | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | de Marneffe, Jean-Francois | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.imecauthor | Hendrickx, Dirk | |
dc.contributor.imecauthor | Lazzarino, Frederic | |
dc.contributor.imecauthor | Milenin, Alexey | |
dc.contributor.imecauthor | Struyf, Herbert | |
dc.contributor.imecauthor | Boullart, Werner | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.contributor.orcidimec | Lazzarino, Frederic::0000-0001-7961-9727 | |
dc.contributor.orcidimec | Milenin, Alexey::0000-0003-0747-0462 | |
dc.contributor.orcidimec | Boullart, Werner::0000-0001-7614-2097 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.conference | 3rd International Plasma Etch and Strip for Microelectronics Workshop - PESM | |
dc.source.conferencedate | 5/03/2010 | |
dc.source.conferencelocation | Grenoble France | |
dc.identifier.url | http://imec-events.be/UserFiles/76/File/Presentations/S3/S3_PESM2010_JFdM.pdf | |
imec.availability | Published - open access | |