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Three fast test methods used for large scale MEMS arrays
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Three fast test methods used for large scale MEMS arrays
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Date
2010
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Wolf, Ingrid
;
Parton, Els
Journal
Semiconductor International China
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1805
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Acq. date: 2025-12-16
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Metrics
Views
1805
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-16
Citations