Show simple item record

Harmonic distortion of strained triple-gate FinFETs at low temperatures

dc.contributor.authorDoria, R.T.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorPavanello, M.A.
dc.date.accessioned2021-10-18T16:05:49Z
dc.date.available2021-10-18T16:05:49Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17036
dc.sourceIIOimport
dc.titleHarmonic distortion of strained triple-gate FinFETs at low temperatures
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage57
dc.source.endpage59
dc.source.conference9th International Workshop on Low Temperature Electronics - WOLTE
dc.source.conferencedate21/06/2010
dc.source.conferencelocationGuaruja Brazil
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
21833.pdf
Size:
277.5Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record