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Quantitative prediction of junction leakage in bulk-technology CMOS devices

dc.contributor.authorDuffy, R.
dc.contributor.authorHeringa, A.
dc.contributor.authorVenezia, V.C.
dc.contributor.authorLoo, Josine
dc.contributor.authorVerheijen, M.A.
dc.contributor.authorHopstaken, M.J.P.
dc.contributor.authorvan der Tak, K.
dc.contributor.authorde Potter de ten Broeck, Muriel
dc.contributor.authorHooker, J.C.
dc.contributor.authorMeunier-Beillard, P.
dc.contributor.authorDelhougne, R.
dc.date.accessioned2021-10-18T16:07:18Z
dc.date.available2021-10-18T16:07:18Z
dc.date.issued2010
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17043
dc.sourceIIOimport
dc.titleQuantitative prediction of junction leakage in bulk-technology CMOS devices
dc.typeJournal article
dc.contributor.imecauthorde Potter de ten Broeck, Muriel
dc.source.peerreviewyes
dc.source.beginpage243
dc.source.endpage251
dc.source.journalSolid-State Electronics
dc.source.issue3
dc.source.volume54
imec.availabilityPublished - imec


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