Quantitative prediction of junction leakage in bulk-technology CMOS devices

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Authors

Duffy, R.; Heringa, A.; Venezia, V.C.; Loo, Josine; Verheijen, M.A.; Hopstaken, M.J.P.; van der Tak, K.; de Potter de ten Broeck, Muriel; Hooker, J.C.; Meunier-Beillard, P.; Delhougne, R.

ISSN

0038-1101

Issue

3

Journal

Solid-State Electronics

Volume

54

Title

Quantitative prediction of junction leakage in bulk-technology CMOS devices

Publication type

Journal article

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