Quantitative prediction of junction leakage in bulk-technology CMOS devices

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Author(s)

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Verheijen, M.A.

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Hopstaken, M.J.P.

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van der Tak, K.

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de Potter de ten Broeck, Muriel

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Meunier-Beillard, P.

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Journal

Solid-State Electronics

Metrics

2011 since deposited on 2021-10-18

Acq. date: 2025-10-25