Publication:
Quantitative prediction of junction leakage in bulk-technology CMOS devices
Date
| dc.contributor.author | Duffy, R. | |
| dc.contributor.author | Heringa, A. | |
| dc.contributor.author | Venezia, V.C. | |
| dc.contributor.author | Loo, Josine | |
| dc.contributor.author | Verheijen, M.A. | |
| dc.contributor.author | Hopstaken, M.J.P. | |
| dc.contributor.author | van der Tak, K. | |
| dc.contributor.author | de Potter de ten Broeck, Muriel | |
| dc.contributor.author | Hooker, J.C. | |
| dc.contributor.author | Meunier-Beillard, P. | |
| dc.contributor.author | Delhougne, R. | |
| dc.contributor.imecauthor | de Potter de ten Broeck, Muriel | |
| dc.date.accessioned | 2021-10-18T16:07:18Z | |
| dc.date.available | 2021-10-18T16:07:18Z | |
| dc.date.issued | 2010 | |
| dc.identifier.issn | 0038-1101 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17043 | |
| dc.source.beginpage | 243 | |
| dc.source.endpage | 251 | |
| dc.source.issue | 3 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 54 | |
| dc.title | Quantitative prediction of junction leakage in bulk-technology CMOS devices | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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