Publication:

Quantitative prediction of junction leakage in bulk-technology CMOS devices

Date

2010

Journal article

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

Verheijen, M.A.

;

Hopstaken, M.J.P.

;

van der Tak, K.

;

de Potter de ten Broeck, Muriel

;

;

Meunier-Beillard, P.

;

Journal

Solid-State Electronics

Metrics

2015 since deposited on 2021-10-18

3last month

Acq. date: 2025-12-09