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dc.contributor.authorDuval, Fabrice
dc.contributor.authorMiller, Andy
dc.contributor.authorSlabbekoorn, John
dc.contributor.authorMaenhoudt, Mireille
dc.contributor.authorMeliorisz, Balint
dc.contributor.authorRitter, Daniel
dc.contributor.authorUnal, Nezih
dc.date.accessioned2021-10-18T16:08:24Z
dc.date.available2021-10-18T16:08:24Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17048
dc.sourceIIOimport
dc.titleMask aligner lithography simulation
dc.typeMeeting abstract
dc.contributor.imecauthorDuval, Fabrice
dc.contributor.imecauthorMiller, Andy
dc.contributor.imecauthorSlabbekoorn, John
dc.source.peerreviewyes
dc.source.conference54th International Conference on Electron, Ion, Photon Beam Technology and Nanofabrication
dc.source.conferencedate1/06/2010
dc.source.conferencelocationAnchorage, AK USA
imec.availabilityPublished - imec


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