dc.contributor.author | Duval, Fabrice | |
dc.contributor.author | Miller, Andy | |
dc.contributor.author | Slabbekoorn, John | |
dc.contributor.author | Maenhoudt, Mireille | |
dc.contributor.author | Meliorisz, Balint | |
dc.contributor.author | Ritter, Daniel | |
dc.contributor.author | Unal, Nezih | |
dc.date.accessioned | 2021-10-18T16:08:24Z | |
dc.date.available | 2021-10-18T16:08:24Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17048 | |
dc.source | IIOimport | |
dc.title | Mask aligner lithography simulation | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Duval, Fabrice | |
dc.contributor.imecauthor | Miller, Andy | |
dc.contributor.imecauthor | Slabbekoorn, John | |
dc.source.peerreview | yes | |
dc.source.conference | 54th International Conference on Electron, Ion, Photon Beam Technology and Nanofabrication | |
dc.source.conferencedate | 1/06/2010 | |
dc.source.conferencelocation | Anchorage, AK USA | |
imec.availability | Published - imec | |