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Impact of halo implant on the hot carrier reliability of germanium pMOSFETs

dc.contributor.authorFranco, Jacopo
dc.contributor.authorEneman, Geert
dc.contributor.authorKaczer, Ben
dc.contributor.authorMitard, Jerome
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-18T16:23:36Z
dc.date.available2021-10-18T16:23:36Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17112
dc.sourceIIOimport
dc.titleImpact of halo implant on the hot carrier reliability of germanium pMOSFETs
dc.typeOral presentation
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.source.peerreviewno
dc.source.conference16th Workshop on Dielectrics in Microelectronics - WoDiM
dc.source.conferencedate28/06/2010
dc.source.conferencelocationBratislava Slovak Republic
imec.availabilityPublished - imec
imec.internalnotesP225


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