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Improvements of NBTI Reliability in SiGe p-FETs
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Authors
Franco, Jacopo
;
Kaczer, Ben
;
Cho, Moon Ju
;
Eneman, Geert
;
Groeseneken, Guido
;
Grasser, Tibor
Conference
48th Annual IEEE International Reliability Physics Symposium - IRPS
Title
Improvements of NBTI Reliability in SiGe p-FETs
Publication type
Proceedings paper
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