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TOF- and G-SIMS characterization of organic solar cell materials

dc.contributor.authorFranquet, Alexis
dc.contributor.authorKoctepe, Melih
dc.contributor.authorConard, Thierry
dc.contributor.authorCheyns, David
dc.contributor.authorVoroshazi, Eszter
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-18T16:24:43Z
dc.date.available2021-10-18T16:24:43Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17116
dc.sourceIIOimport
dc.titleTOF- and G-SIMS characterization of organic solar cell materials
dc.typeOral presentation
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorCheyns, David
dc.contributor.imecauthorVoroshazi, Eszter
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecCheyns, David::0000-0002-1327-8752
dc.source.peerreviewno
dc.source.conference5th European Workshop on Secondary Ion Mass Spectrometry - SIMS Europe
dc.source.conferencedate19/09/2010
dc.source.conferencelocationMünster Germany
imec.availabilityPublished - imec


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